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Exact matches for:
- Author = Lee CKM
1.
Liu X, Lee CKM, Huang J, Sun Q
Xingchen Liu, Carman K. M. Lee, Jingyuan Huang, Qiuzhuang Sun:
Online Robustness Degradation Analysis With Measurement Outlier,
IEEE Transactions on Instrumentation and Measurement,
74
(2025),
Article no. 3509212.
| Number of matches: 1 |